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Flat Glass
Glass Coating
Wood and Veneer
Roll-to-Roll (e.g. Foil)
Microstructured Devices
Microfluidic (Lab-on-a-Chip)
Display (TFT, OLED)
Optical Disc

Process Optimization for Production of:

Microfluidic Appliances, Printed Electronics, Light Management Systems, Diffractive Optical Elements, Nano-Imprint Devices

For comprehensive process and quality control of microstructured samples, dr.schwab offers multiple technologies and solutions.
In-line or off-line systems are available or tailored individually.
The systems combine high-precision measurement and powerful data analysis with user-friendly operation.

Fast full surface inspection by line-scan camera
Depending on sample size and requested resolution, one or several line-scan cameras are arranged. Highly precise optical components plus sophisticated methods of image analysis result in reliable detection of all types of local defects.

Inspection of patterns and structures
If there are any patterns (e.g. prints) or structures (e.g. channels) on the sample, the system enables defect detection inside and outside the pattern, applying individual inspection parameters for different regions. The different regions may be defined in a technical drawing (e.g. dxf file), which is imported and matched with the recorded camera picture.
The system also recognizes pattern interruptions (e.g. conducting tracks).

Spot area inspection by microscope matrix camera
On microstructured devices there often are small areas which are crucial for the function. Such areas (also defined at dxf file) may additionally
be inspected by high resolution microscope camera.

Analysis of periodic microstructures by diffraction
Light diffraction is a very sensitive method to check size and shape of regularly arranged microstructures with fixed distance to each other. Using a line-scan camera as 'sensor' even allows full surface evaluation, which enables the detection of certain defect types such as surface roughness, clouds or stripes, which are often quite extensive but are invisible to the usual camera inspection due to lack of contrast in zero order.